■INTRODUCTION
MLCC(MultilayerCeramic Capacitor) is SMD(SurfaceMounted Device) type capacitor that is used in wide ranges of capacitance. MLCC is paid more attentions than other capacitors due to the better frequency characteristics, higher reliability, higher withstanding voltage and so on.
MLCC is made of many layers of ceramic and inner electrodes like sandwich. Pd was used for inner electrodes. But the price of Pd was skyrocketed and Pd was replaced by the BME(BaseMetal Electrode), which reduced the total cost of MLCC.
This inner electrode is connected to outer termination for surface mounting, which is composed of three layers, Cu or Ag layer, Ni plating layer, and SnPb or Sn plating layer. Most of MLCCs become Pb free by the environmental issue at present.
MLCC is divided into two classes. Class I(C0G,etc) is the temperature compensating type. It has a small TCC(TemperatureCoefficient of Capacitance) and a better frequency performance. Therefore, it is used in RF applications such as cellular phone, tuner, and so on. Class II(X7R,X5R, Y5V, etc) is the high dielectric constant type, which is used in general electronic circuit. Especially high capacitance MLCC is replacing other capacitors (Tantalumand Aluminum capacitor) due to the low ESR(EquivalentSeries Resistance) value.
■FEATURE AND APPLICATION
●Feature -Miniature Size
-Wide Capacitance and Voltage Range -Highly Reliable Performance
-Tape &Reel for Surface Mount Assembly -Low ESR
-High Q at High Frequencies
-Stable Temperature Dependence of Capacitance ●Application
-High Frequency Circuit(Tuner,VCO, PAM etc) -General Power Supply Circuit(SMPSetc) -DC-DC Converter
-General Electronic Circuit
■
STRUCTURE
■APPEARANCE AND DIMENSION
CODE [**************]5
EIA CODE
L
[***********][1**********]220
0.6±0.031.0±0.051.6±0.12.0±0.13.2±0.23.2±0.34.5±0.45.7±0.4
DIMENSION (mm ) W 0.3±0.030.5±0.050.8±0.11.25±0.11.6±0.22.5±0.23.2±0.35.0±0.4
T (MAX)0.3±0.030.5±0.050.8±0.11.25±0.11.6±0.22.5±0.23.2±0.33.2±0.3
BW 0.15±0.050.2+0.15/-0.10.3±0.20.5+0.2/-0.30.5+0.2/-0.30.6±0.30.8±0.31.0±0.3
■PREVIOUS PART NUMBERING
SAMSUNG Multilayer Ceramic Capacitor ●
Type(Size)●
Capacitance Temperature Characteristics ●
Nominal Capacitance ●
Capacitance Tolerance ●
Rated Voltage ●
Thickness Option ●
Packaging Type ●
CAPACITANCE TEMPERATURE CHARACTERISTICS ●
CLASS Ⅰ(TemperatureCompensation) Symbol C P R S T U L
EIA Code C0G(CH)P2H R2H S2H T2H U2J S2L
Temperature
Coefficient(PPM/℃)
0±30-150±60-220±60-330±60-470±60-750±120+350~-1000
※Temperature
Characteristics
C ΔP ΔR ΔS ΔT ΔU ΔSL
Operation
Temperature Range
-55~+125℃
※Temperature Characteristics Temperature
below 2.0pF 2.2~3.9pF above 4.0pF
Characteristics
C ΔP ΔR ΔS ΔT ΔU Δ
C0G -----C0G P2J R2J S2J T2J U2J
C0G P2H R2H S2H
T2H U2J
above 10pF
C0G P2H R2H S2H T2H U2J
☞K :±250PPM/℃J :±120PPM/℃H :±60PPM/℃G :±30PPM/℃
CLASS Ⅱ(HighDielectric Constant)
Symbol A B F
EIA Code X5R X7R Y5V
Capacitance Change
(ΔC :%)
±15±15+22~-82
Operation
Temperature Range
-55~+85℃-55~+125℃-30~+85℃
NOMINAL CAPACITANCE ●
The nominal capacitance value is expressed in pico-Farad(pF)and identified by three-digit number, first two digits represent significant figures and last digit specifies the number of zeros to follow. For values below 1pF, the letter "R" is used as the decimal point and the last digit becomes significant.
example)
100:10×10o =020:2×10o =1R5:1.5pF
10pF 2pF
102:10×
102=1000pF
CAPACITANCE TOLERANCE ●
Temperature Characteristics
Symbol B C
C0G(NPO)
or T.C Series
D F G J K
A(X5R)B(X7R)F(Y5V)
J K M Z
Tolerance ±0.1pF ±0.25pF ±0.5pF ±1pF ±2%±5%±10%±5%±10%±20%-20%~+80%
E-6Series E-12Series
E-24Series for over 10pF Applicable Capacitance &Range
0.5~3pF 0.5~10pF 6~10pF
※Please consult us for special tolerances.
RATED VOLTAGE ●
THICKNESS OPTION ●Symbol N A B C D E
Description of the Code
Standard thickness (pleaserefer to standard thickness table on next page) Thinner than standard thickness Thicker than standard thickness
Standard Thickness High Q (Low `D.F `) Sn-100%(High-Q)Sn-100%(General)
※Please Consult us for other termination type.
PACKAGING TYPE ●STANDARD CAPACITANCE STEP Series E-3E-6E-12E-24
1.01.01.1
1.0
1.21.21.3
1.51.51.61.0
1.5
1.81.82.0
2.22.22.4
2.2
2.72.73.0
3.33.33.6
Capacitance Step
2.2
3.3
3.93.94.3
4.74.75.1
4.7
5.65.66.2
6.86.87.54.7
6.8
8.28.29.1
※Standard Capacitance is " Each step ×10n "
■NEW PART NUMBERING
SAMSUNG Multilayer Ceramic Capacitor ●
Size(mm)●
Capacitance Temperature Characteristic ●
Nominal Capacitance ●
Capacitance Tolerance ●
Rated Voltage ●
Thickness Option ●
Product &Plating Method ●
Samsung Control Code ●
Reserved For Future Use ●
Packaging Type ●
PRODUCT ABBREVIATION ●
Symbol CL
Product Abbreviation
SAMSUNG Multilayer Ceramic Capacitor
SIZE(mm)●
Symbol [**************]5
Size(mm)
Length 0.61.01.62.03.23.24.55.7
Width 0.30.50.81.21.62.53.25.0
CAPACITANCE TEMPERATURE CHARACTERISTIC ●Symbol C P R S T U L A B F
Class ⅡClass Ⅰ
Temperature Characteristics COG P2H R2H S2H T2H U2J S2L X5R X7R Y5V
C △P △R △S △T △U △S △X5R X7R Y5V
0±30(ppm/℃) -150±60-220±60-330±60-470±60-750±60+350~-1000
±15%±15%+22~-82%
-55~+85℃-55~+125℃-30~+85℃-55~+125℃Temperature Range
※Temperature Characteristic
Temperature Characteristics
C ΔP ΔR ΔS ΔT ΔU Δ
Below 2.0pF
C0G -----2.2~3.9pF
C0G P2J R2J S2J T2J U2J
Above 4.0pF
C0G P2H R2H S2H T2H U2J
Above 10pF
C0G P2H R2H S2H T2H U2J
J :±120PPM/℃, H :±60PPM/℃, G :±30PPM/℃
NOMINAL CAPACITANCE ●
Nominal capacitance is identified by 3digits.
The first and second digits identify the first and second significant figures of the capacitance. The third digit identifies the multiplier. 'R' identifies a decimal point. ●Example
Symbol 1R5103104
Nominal Capacitance
1.5pF
10,000pF, 10nF, 0.01μF 100,000pF, 100nF, 0.1μF
CAPACITANCE TOLERANCE ●
Symbol A B C D F F G J K M Z
Tolerance ±0.05pF ±0.1pF ±0.25pF ±0.5pF ±1pF ±1%±2%±5%±10%±20%+80,-20%
More than 10pF Less than 10pF (Including10pF) Nominal Capacitance
RATED
VOLTAGE ●
THICKNESS OPTION ●
Type [1**********]8
Symbol
358A
2012
C F C
3216
F H F H
3225
I J F H
4532
I J L F H
5750
I J L
2.02.51.251.6
±0.20
2.02.53.21.251.6
±0.20
2.02.53.2
±0.30±0.30
Thickness(T)
0.300.500.800.65
±0.10
0.851.250.851.251.61.251.6
±0.20±0.10±0.15±0.15±0.20Spec ±0.03±0.05±0.10
PRODUCT &PLATING METHOD ●Symbol A N G
Electrode
Pd Ni Cu
Termination
Ag Cu Cu
Plating Type Sn_100%Sn_100%Sn_100%
SAMSUNG CONTROL CODE
●
RESERVED FOR FUTURE USE ●
Symbol N
Description of the code Reserved for future use
PACKAGING TYPE
●
CAPACITANCE vs CHIP THICKNESS STANDARD
Description
[1**********]8(0201)(0402)(0603)
0.6±0.030.3±0.030.3±0.03
1.0±0.050.5±0.050.5~±0.050.5~240
1.6±0.10.8±0.10.8±0.1
0.65±0.1
2012Type (0805)
2.0±0.1
3216Type (1206)
3.2±0.15
3.2±0.21.6±0.2
3225Type (1210)
3.2±0.3
4532Type (1812)
4.5±0.4
5750Type (2220)
5.7±0.4
L
Dimension (mm)
W 1.25±0.10.85±0.1
1.6±0.152.5±0.2
1.251.6±0.2±0.2
2.0±0.2
2.5±0.2
1.25±0.2
3.2±0.31.6±0.2
2.0±0.2
2.5±0.2
5.0±0.41.62.0±0.2±0.2
2.5±0.2
T
1.250.851.251.6±0.1±0.15±0.15±0.2
SL 50V C R A A P N A
25V G C
E I
T C, TC p A (ExceptF N SL,UJ) C
50V E
-
0.5~0.5~1600~0.5~3000~6200~
1000~[***********]008200
-----------
0.5~470.5~2200.5~1000
--
3300~1500~3900~7500~[**************]00
----------
()
-
0.5~1800.5~10000.5~620~1100~0.5~2400~[***********]0
-
560~1100024000~
~
[**************]
-
1000~24000~62000~[**************]0
[***********]00
6.3V 102202200--10000--100004700~100004700
---22000---47000--47000
10V
A (X5R)
[1**********]0~470-
--2200-----220006800~10000-
------47000
16V -47--1000------------
25V --6.8~1047~10033~10010~334.7~100.22~4.7-220~33010~22010~332.2~10
----------------
50V
C A P A C I T A N C E R A N G E (n F )
6.3V
F (Y5V)
-0.1~100.1~100.1~1-
-470~1000220~470100~22047~1000.22~1002200100~1000100~100022~3302.2~100
------6800~10000
-----------
6.3V -220~27068~20039~680.22~39-
-330~470220~33082~10047~100-
1000560~1000390~1000150~470220
-----22000-------
10V
B (X7R)
-
1000~47001500~33003900~[1**********]0
----22000---
16V
330~1000~2200~1500~33003900~[***********]0100~470~3306201~150-220
680~1000390~1000-680~180015002.2~680-820~1000-2200
---2200----
25V --10~1000-
-1000---100003300~4700-
50V -10~100-
-------
10000-47000------
10V -10~68010~2202.2~68
-4700-
470010000~
22000
---22000------100000
16V -
820~1200~1000~2700~100003300~[***********][**************]~47082~150
560~1000180~1000
470~1200~2700~1000~4700~[***********]00010~470
560~1000
-100~1000
--
---22000----
25V -----10000---
50V ------10000---
■PACKAGING
●CARDBOARD PAPER TAPE
Symbol Type
03
D i m e n s i o n
05102131
W F E P1
2.0±0.05
P2P0D t
0.37±0.030.6±0.05
A
0.38±0.03
B
0.68±0.03
0.651.15+0.05/-0.1+0.05/-0.11.1±0.2
1.9±0.22.4±0.23.6±0.2
8.0±0.33.5±0.051.75±0.1
4.0±0.1
2.0±0.054.0±0.1Φ1.5+0.1/-0
1.1MAX
1.6±0.22.0±0.2
●EMBOSSED PLASTIC TAPE
●TAPING SIZE
unit :pcs
Symbol 7" Reel 13" Reel
Cardboard Paper Tape
400015000
Embossed Plastic Tape
2000-
●REEL DIMENSION
unit :mm
Symbol 7" Reel 13" Reel
A φ178±2.0φ330±2.0
B min. φ50min. φ70
φ13±0.5
21±0.8
2.0±0.5
10±1.5
0.8±0.2
1.0
C
D
E
W
t
R
●BULK CASE PACKAGING
-Bulk case packaging can reduce the stock space and transportation costs. -The bulk feeding system can increase the productivity. -It can eliminate the components
loss.
Symbol Dimension Symbol Dimension
A 6.8±0.1F 31.5+0.2/-0
B 8.8±0.1W 36+0/-0.2
T 12±0.1G 19±0.35
C 1.5+0.1/-0
H 7±0.35
D 2+0/-0.1
L 110±0.7
E 4.7±0.1
I 5±0.35
●QUANTITY
Size Quantity *Option
05(0402)50,000
10(0603)10,000~15,000*
21(0805)
T ≤0.85mm 10,000
T ≥1.0mm 5,000
■CHARACTERISTIC MAP
●CLASS Ⅰ
Temperature Characteristics
Size 05(0402)10(0603)
Voltage
0.5
10
100
240
1000
Capacitance Range (㎊)
10000
100000
[**************]
100000000
50V
50V 1000
SL,UJ
21(0805)31(1206)03(0201)05(0402)
50V
2700
50V
8200
25V 25V 50V 25V 50V 25V 50V 25V 50V 50V 100V 25V 50V 50V
47
220180
[1**********]0
33001500
100008200
10(0603)
21(0805)
C(COG)&TC Series
31(1206)
4700
560
4700
4700018000
100000
1000
43000
68000
130000
32(1210)
43(1812)55(2220)
●CLASS Ⅱ, A(X5R)
Temperature Characteristics
Size Voltage
10
100
Capacitance Range (㎊)
1000
10000
100000
[***********]000000
0603(0201)
6.3V 10V 6.3V
1000010000
[1**********]0
47000
6800
10000
[1**********]000
330000
470000
10000000
[1**********]000
10000000
4700000
[**************]
[**************]0
6800000
10000000
[***********]000000
1005(0402)
10V 16V 50V 6.3V
1608(0603)
10V 16V 6.3V
A(X5R)
2012(0805)
10V 16V 6.3V
3216(1206)
10V 16V 6.3V
3225(1210)
10V 16V
4532(1812)5750(2220)
6.3V 6.3V 10V
●CLASS Ⅱ, B(X7R)
Temperature Characteristics
Capacitance Range (㎊)
Size
Voltage
10
[1**********]0
1000
[***********]0
220
4700
[***********]47000
220
[***********][1**********]00
1000000
[**************]0
220
[***********]00220000
[1**********]000
[***********][***********]000
6.3V
03(0201)
10V 16V 6.3V 10V
05(0402)
16V 25V 50V 6.3V 10V
10(0603)
16V 25V 50V 6.3V 10V
21(0805)
16V 25V 50V 6.3V 10V
31(1206)
16V 25V 50V
1000010000
[1**********]0
33000
10000
B(X7R)
10000000
[***********]0001000000
[1**********]0
1000
●CLASS Ⅱ, B(X7R)
Temperature Characteristics
Capacitance Range (㎊)
Size
Voltage
10
100
1000
10000
100000
[***********]000000
22000000
[***********]00
2200
[***********]0001000000
22000000
[1**********]000
10000
1000000
10000000
3300000
4700000
6.3V 10V
32(1210)
16V 25V 50V
B(X7R)
43(1812)
10V 16V 25V 50V
55(2220)
25V 50V
●CLASS Ⅱ, F(Y5V)
Temperature Characteristics
Size
03(0201)
Voltage
10
100
1000
Capacitance Range (㎊)
1000010000
220000
1000010000
2200
3300010000
2200000
[1**********]0
22000
2200
[1**********]0
10000000
4700000
1000010000
2200
[***********]0004700000
[***********][1**********]0
100000
[1**********]0
6.3V 10V
05(0402)
16V 25V 50V 6.3V 10V
[1**********]000
10(0603)
16V 25V 50V 6.3V 10V
21(0805)
16V 25V
F(Y5V)
50V 10V
31(1206)
16V 25V 50V 6.3V 10V
32(1210)
16V 25V 50V 16V
43(1812)
25V 50V
55(2220)
10V
100000
[1**********]000
1000000
[***********]000000
100000000
10000
[**************]0
[1**********]00
[1**********]000
[***********][1**********]000
■RELIABILITY TEST DATA
NO 1
ITEM APPEARANCE
PERFORMANCE
NO ABNORMAL EXTERIOR APPEARANCE 10,000㏁OR 500㏁·㎌PRODUCT WHICHEVER IS
2
INSULATION RESISTANCE
SMALLER
(RATEDVOLTAGE IS BELOW 16V :10,000㏁OR 100㏁·㎌)
TEST CONDITION
THROUGH MICROSCOPE(×10)
RATED VOLTAGE SHALL BE APPLIED.
MEASUREMENT TIME IS 60~120RATED VOLTAGE TIME 60SEC.
3
WITHSTANDING
VOLTAGE
NO DIELECTRIC BREAKDOWN OR MECHANICAL BREAKDOWN
CLASS Ⅰ:300%OF THE RATED VOLTAGE FOR 1~5SEC, CLASS Ⅱ:250%OF THE RATED VOLTAGE FOR 1~5SEC IS APPLIED WITH LESS THAN 50㎃CURRENT
CAPACITANCE
CLASS Ⅰ
4
CAPACIT ANCE
CLASS Ⅱ
WITHIN THE SPECIFIED TOLERANCE
WITHIN THE SPECIFIED TOLERANCE
1,000㎊AND BELOW MORE THAN 1,000㎊CAPACITANCE 10㎌AND BELOW MORE THAN
10㎌CAPACITANCE
CLASS Ⅰ
OVER 30㎊:Q ≥1,000
LESS THAN 30㎊:Q ≥400+20C
(C :CAPACITANCE )
1,000㎊AND BELOW MORE THAN 1,000㎊
FREQUENCY 1㎒±10%
VOLTAGE
0.5~5Vrms
1㎑±10%FREQUENCY 1㎑±10%120㎐±20%FREQUENCY 1㎒±10%
0.5~5Vrms
1㎑±10%FREQUENCY 1㎑±10%120㎐±20%
VOLTAGE 1.0±0.2Vrms 0.5±0.1Vrms VOLTAGE 1.0±0.2Vrms 0.5±0.1Vrms VOLTAGE
5Q
1. CHAR :B
RATED VOLTAGE
CAPACITANCE
DF SPEC 0.05max 0.05max 0.035max 0.025max 0.025max
10㎌AND BELOW MORE THAN 10㎌
6.3V 10V 16V 25V 50V 이상
2. CHAR :F
6
Tan δ
CLASS Ⅱ
[***********]2545325750
6.3V -0.16max 0.16max 0.16max 0.16max 0.16max
10V 0.125max 0.125max 0.125max 0.125max 0.125max 0.16max 0.125max
16V 25V 0.05max 0.05max(C≤100nF) 0.07max(C>100nF)
0.07max 0.07max 0.07max(C≤6.8㎌) 0.09max(C>6.8㎌)
--
50V 0.05max 0.05max 0.05max 0.05max 0.05max
--
0.09max (C<220nF) 0.125max (C≥220nF)
0.09max 0.09max 0.09max 0.09max 0.09max
-
*THE INITIAL VALUE OF HIGH DIELECTRIC CONSTANT SERIES SHALL BE MEASURED
AFTER THE HEAT TREATMENT OF 150+0/-10℃, 1Hr AND SITTING OF 48±4hr AT ROOM TEMPERATURE &ROOM HUMIDITY.
NO
ITEM
APPEARANCE
PERFORMANCE
NO MECHANICAL DAMAGE SHALL OCCUR CHARACTERISTIC
CAPACITANCE CHANGE WITHIN ±5%OR
CAPACITANCE
CLASS Ⅰ
±0.5㎊WHICHEVER IS LARGER
CLASS Ⅱ
Q
HUMIDITY
14
(STEADYSTATE)
CLASS Ⅰ
A,B F
WITHIN ±12.5%WITHIN ±30%
MEASURE AT ROOM TEMPERATURE AFTER COOLING FOR CLASS Ⅰ:24±2Hr. CLASS Ⅱ:48±4Hr.
6.3V Tan δ
6.3V 0.075MAX
4V 0.1MAX
TEST CONDITION
TEMPERATURE TEST TIME
:40±2℃
RELATIVE HUMIDITY:90~95%RH
:500+12/-0Hr.
30㎊AND OVER :Q ≥35010~30㎊
:Q ≥275+2.5×C
LESS THAN 10pF :Q ≥200+10×C
CHAR.
25V AND OVER 0.05
16V
10V 0.05MAX
0.125MAX *Condition1005C ≥0.22㎌1608C ≥2.2㎌2012C ≥4.7㎌3216C ≥10.0㎌3225C ≥22.0㎌4532C ≥47.0㎌5750C ≥100.0㎌
Tan δCLASS Ⅱ
A,B 0.05MAX 0.1MAX (C〈1.0㎌) 0.125MAX (C≥1.0㎌)
CLASS Ⅱ(A,B)
F
0.075MAX 0.15MAX 0.195MAX 0.25MAX
INSULATION RESISTANCE APPEARANCE
MINIMUM INSULATION RESISTANCE:
1,000㏁OR 50㏁·㎌PRODUCT WHICHEVER IS SMALLER
NO MECHANICAL DAMAGE SHALL OCCUR CHARACTERISTIC
CAPACITANCE CHANGE WITHIN ±7.5%OR
CLASS Ⅰ
±0.75㎊WHICHEVER IS LARGER
A,B
WITHIN ±12.5%WITHIN ±30%WITHIN +30~-40%
CLASS
Ⅱ
F
1005C>0.47μF 1608C>1.0μF 2012C>4.7μF 3216C>10.0μF 3225C>22.0μF 4532C>47.0μF
APPLIED VOLTAGE :
RATED VOLTAGE
TEMPERATURE :40±2℃RELATIVE HUMIDITY:90~95%RHTEST TIME :500+12/-0Hr. CURRENT APPLIED :50㎃MAX.
CLASS ⅡSHOULD BE MEASURED INITIAL VALUE AFTER BE HEAT-TREATED FOR 1HR IN 150℃+0/-10℃AND BE LEFT FOR 48±4HR AT ROOM TEMPERATURE.
CLASS ⅠSHOULD BE MEASURED AFTER LEFT FOR 24±2HRS IN ROOM TEMPERATURE AND HUMIDITY. CLASS ⅡSHOULD BE MEASURED LATTER VALUE AFTER BE
HEAT-TREATED FOR 1HR IN 150℃+0/-10℃AND BE LEFT FOR 48±4HR AT ROOM TEMPERATURE.
CAPACITANCE
MOISTURE
15
RESISTANCE
Q CLASS Ⅰ
30㎊AND OVER :Q ≥200
30㎊AND BELOW :Q ≥100+10/3×C
CHAR.
25V AND OVER 0.05MAX
16V
10V
6.3V
4V
6.3V Tan δ0.125MAX *Condition1005C ≥0.22㎌
Tan δCLASS Ⅱ
A,B
0.05MAX 0.1MAX (C〈1.0㎌) 0.125MAX (C≥1.0㎌)
0.05MAX 0.075MAX 0.1MAX
CLASS Ⅱ(A,B)
1608C ≥2.2㎌2012C ≥4.7㎌3216C ≥10.0㎌3225C ≥22.0㎌4532C ≥47.0㎌5750C ≥100.0㎌
F
0.075MAX 0.15MAX 0.195MAX 0.25MAX
INSULATION RESISTANCE
MINIMUM INSULATION RESISTANCE:500㏁OR 25㏁·㎌PRODUCT, WHICHEVER IS SMALLER.
NO
ITEM
PERFORMANCE
TEST CONDITION
APPLIED VOLTAGE :
150%,200%OF RATED VOLTAGE TEST TIME :1000+48/-0Hr. CURRENT APPLIED :50㎃MAX.
APPEARANCE NO MECHANICAL DAMAGE SHALL OCCUR
CHAR.
CHARACTERISTIC
CLASS Ⅰ
A,B
CAP. CHANGE
WITHIN ±3%OR ±0.3㎊, WHICHEVER IS LARGER WITHIN ±12.5%WITHIN ±30%
CAPACITANCE
CLASS Ⅱ
HIGH
16
TEMPERATURE RESISTANCE
Q CLASS Ⅰ
10~30㎊
F
WITHIN+30~40%1005C>0.47μF 1608C>1.0μF 2012C>4.7μF 3216C>10.0μF 3225C>22.0μF 4532C>47.0μF
30㎊AND OVER :Q ≥350
:Q ≥275+2.5×C
LESS THAN 10㎊:Q≥200+10×C CHAR.
AND OVER
TEMP. 125±3℃
A
85±3℃125±3℃85±3℃
CLASS ⅠCLASS Ⅱ
B F
CLASS ⅡSHOULD BE MEASURED INITIAL VALUE AFTER BE HEAT-TREATED FOR 1HR IN 150℃+0/-10℃AND BE LEFT FOR 48±4HR AT ROOM TEMPERATURE.
CLASS ⅠSHOULD BE MEASURED AFTER LEFT FOR 24±2HRS IN ROOM TEMPERATURE AND HUMIDITY.
CLASS ⅡSHOULD BE MEASURED LATTER VALUE AFTER BE HEAT-TREATED FOR 1HR IN 150℃+0/-10℃AND BE LEFT FOR 48±4HR AT ROOM TEMPERATURE.
*150%Authorization
Conditions
25V
16V 0.05MAX
0.1MAX (C
10V 0.05MAX
6.3V 0.075MAX
4V 0.1MAX
1005C>0.47μF 1608C ≥2.2㎌
CLASS Ⅱ(A,B,F)
2012C ≥4.7㎌3216C ≥10.0㎌3225C ≥22.0㎌4532C ≥47.0㎌5750C ≥100.0㎌
Tan δCLASS Ⅱ
A,B
0.05MAX
F
0.075MAX 0.15MAX 0.195MAX 0.25MAX
(TWICEOF RATED VOLTAGE WILL BE
INSULATION RESISTANCE
MINIMUM INSULATION RESISTANCE:1,000㏁OR 50㏁·㎌PRODUCT WHICHEVER IS SMALLER
NO MECHANICAL DAMAGE SHALL OCCUR CHARACTERISTIC
CAP. CHANGE
WITHIN ±2.5%
APPLIED TO ALL SERIES BUT ABOVE) **HOWEVER, SEE (FIG.3)
A/B는1005C ≥0.22㎌
APPEARANCE
CAPACITORS SHALL BE SUBJECTED TO FIVE CYCLES OF THE
TEMPERATURE CYCLE AS FOLLOWING STEP 1234
TEMP.(℃) MIN.RATED TEMP.+0/-3
25MAX.RATED TEMP.+3/-0
25
TIME(MIN)
302~3302~3
CAPACITANCE
CLASS ⅠOR ±0.25㎊WHICHEVER IS LARGER
CLASS
17
TEMPERATURE
CYCLE
Q CLASS ⅠTan δCLASS ⅡINSULATION RESISTANCE
Ⅱ
A,B F
WITHIN ±7.5%WITHIN ±20%
30㎊AND OVER :Q ≥1000LESS THAN 30㎊:Q≥400+20×C TO SATISFY THE SPECIFIED INITIAL VALUE
TO SATISFY THE SPECIFIED INITIAL VALUE
MEASURE AT ROOM TEMPERATURE AFTER COOLING FOR CLASS Ⅰ:24±2Hr. CLASS Ⅱ:48±4Hr.
■CHARACTERISTIC GRAPH
●ELECTRICAL CHARACTERISTICS
CAPACITANCE -TEMPERATURE CHARACTERISTICS
CAPACITANCE -DC VOLTAGE CHARACTERISTICS CAPACITANCE CHANGE -
AGING
■APPLICATION MANUAL
●Storage Condition
Storage Environment
The electrical characteristics of MLCCs were degraded by the environment of high temperature or humidity. Therefore, the MLCCs shall be stored in the ambient temperature and the relative humidity of less than 40℃and 70%,respectively. Guaranteed storage period is within 6months from the outgoing date of delivery.
Corrosive Gases
Since the solderability of the end termination in MLCC was degraded by a chemical atmosphere such as chlorine, acid or sulfide gases, MLCCs must be avoid from these gases.
Temperature Fluctuations
Since dew condensation may occur by the differences in temperature when the MLCCs are taken out of storage, it is important to maintain the temperature-controlled environment.
●Design of Land Pattern
When designing printed circuit boards, the shape and size of the lands must allow for the
proper amount of solder on the capacitor. The amount of solder at the end terminations has a direct effect on the crack. The crack in MLCC will be easily occurred by the tensile stress which was due to too much amount of solder. In contrast, if too little solder is applied, the termination strength will be insufficiently. Use the following illustrations as guidelines for proper land design. Recommendation of Land Shape and Size
●Adhesives
When flow soldering the MLCCs, apply the adhesive in accordance with the following conditions. Requirements for Adhesives
They must have enough adhesion, so that, the chips will not fall off or move during the handling of the circuit board.
They must maintain their adhesive strength when exposed to soldering temperature. They should not spread or run when applied to the circuit board. They should harden quickly.
They should not corrode the circuit board or chip material.
They should be a good insulator.
They should be non-toxic, and not produce harmful gases, nor be harmful when touched. Application Method
It is important to use the proper amount of adhesive. Too little and much adhesive will cause poor adhesion and overflow into the land, respectively.
Adhesive hardening Characteristics
To prevent oxidation of the terminations, the adhesive must harden at 160℃or less, within 2minutes or less.
●Mounting
Mounting Head Pressure
Excessive pressure will cause crack to MLCCs. The pressure of nozzle will be 300g maximum during mounting.
Bending Stress
When double-sided circuit boards are used, MLCCs first are mounted and soldered onto one side of the board. When the MLCCs are mounted onto the other side, it is important to support the board as shown in the illustration. If the circuit board is not supported, the crack occur to the ready-installed MLCCs by the bending stress.
●Flux
Although the solderability increased by the highly-activated flux, increase of activity in flux may also degrade the insulation of the chip capacitors. To avoid such degradation, it is recommended that a mildly activated rosin flux(lessthan 0.2%chlorine) be used.
●Soldering
Since a multilayer ceramic chip capacitor comes into direct contact with melted solder during soldering, it is exposed to potentially mechanical stress caused by the sudden temperature change. The capacitor may also be subject to silver migration, and to contamination by the flux. Because of these factors, soldering technique is critical. Soldering Methods
Method
-Overall heating
Reflow soldering
-Local heating
Flow soldering
-Single wave -Double wave
Classification
-Infrared rays -Hot plate
-VPS(vaporphase) -Air heater -Laser
-Light beam
-
*We recommend the reflow soldering method.
Soldering Profile
To avoid crack problem by sudden temperature change, follow the temperature profile in the adjacent
graph.
℃
[**************]50
℃
300250200
15010050
60~120sec3~4sec
Reflow Soldering Flow Soldering
Manual Soldering
Manual soldering can pose a great risk of creating thermal cracks in chip capacitors. The hot
soldering iron tip comes into direct contact with the end terminations, and operator's carelessness
may cause the tip of the soldering iron to come into direct contact with the ceramic body of the capacitor. Therefore the soldering iron must be handled carefully, and close attention must be paid to the selection of the soldering iron tip and to temperature control of the tip.
Amount of
Solder
Cooling
Natural cooling using air is recommended. If the chips are dipped into solvent for cleaning, the temperature difference(△T) must be less than 100℃6-6. Cleaning
If rosin flux is used, cleaning usually is unnecessary. When strongly activated flux is used, chlorine in the flux may dissolve into some types of cleaning fluids, thereby affecting the chip capacitors. This means that the cleaning fluid must be carefully selected, and should always be new.
Notes for Separating Multiple, Shared PC Boards.
A multi-PC board is separated into many individual circuit boards after soldering has been
completed. If the board is bent or distorted at the time of separation, cracks may occur in the chip capacitors. Carefully choose a separation method that minimizes the bending of the circuit board.
■CROSS REFERENCE
P/N
①COMPANY
COMPANY
MODEL(MLCC)
0201(0603)0402(1005)0603(1608)0805(2012)
②SIZE (EIA/JIS)
1206(3216)1210(3225)1808(4520)1812(4532)2220(5750)
SAMSUNG
CL [***********]
AVX --[***********]1018081812-
JOHANSON
--R07R14R15R18S41R29S43-
KEMET C -[***********][1**********]220
KYOCERA
CM [***********]55
MURATA GRM 3336394042-642-2-43-244-1
NOVACAP
--[***********][1**********]221
PANASONIC
ECJ Z 01234---
ROHM MCH -1518213132-43-
TAIYO -YUDEN MK [***********]-432550
TDK C [***********][***********]
VITRAMON
VJ -[***********]1018081812-
COG(NPO)C A N G CG COG/CHN C A C COG/CHA
P2H(N150)R2H(N220)S2H(N330)
③
TEMPERATURE CHARACTERISTIC
U2J(N750)
S2L X7R Z5U T2H(N470)
P R S T U L B E
S 13O Z Y C E
------W Z
------R(X)U
P R S T U SL X7R -
P2H R2H S2H T2H U2J SL X7R Z5U
------B Z
P R S T U G B -
----UJ SL C E
P R S T U SL BJ -
PH RH SH TH UJ SL X7R(B)Z5U
------Y(X)U
Y5V F G Y V Y5V Y5V Y F F F Y5V -
④NOMINAL CAPACITANCE ⑤CAPACITANCE TOLERANCE
6.3V 10V 16V 25V 50V 100V 200V 250V 500V 630V 1000V 2000V 3000V 4000V NICKEL BARRIER
⑦TERMINATION
Ag/PdBULK(VINYL)PAPER TAPING
⑧PACKAGE
PLASTIC TAPING BULK CASE
E P
1, 37
E, U -P B C
192, 4
-(NONE)T, R
Q P O A B C D E G H I J K -N
6Z Y 3512V 7-A G H J T
V B:±0.1㎊
-[***********]-501-102202302
EX) 103=10,000㎊C:±0.25㎊
9843512-------C -----D:±0.5㎊
[***********][***********]04000A B B T, L H, N C
221=220㎊
F:±1%
6.[***********]5006301K 2K 3K -(GRM)(GR)PB PT PT PC
225=2,200,000㎊=2.2㎌G:±2%
--[***********]501-[1**********]2N P *T --J:±5%
1R5=1.5㎊K:±10%0J 1A 1C 1E 1H 2A 2D ---------X E,V,W F, Y C
010=1㎊
Z:-20~+80%
J L E T U -----------B T T -0J 1A 1C 1E 1H 2A -2E -2J 3A 3D 3F ---B T ----J X A B C -E -G -H -X F B C, P T, R G
M:±20%
-43251--------(MCH)(MC)-K, L P, Q C
⑥RATED VOLTAGE
SAMSUNG :CL10B104KA8NNNC
AVX :06033C104KAT2A
JOHANSON :250R14W104KV6T
KEMET :C0603C104K3RAC
KYOCERA :CM105X7R104K25AT
MURATA :GRM188R71E104KA01D
NOVACAP :0603B104K250N_TM
PANASONIC :ECJ1EB1E104K
ROHM :MCH182C104KKN
TAIYO-YUDEN :TMK107BJ104K_T
TDK :C1608X7R1E104KT
VITRAMON :VJ0603Y104KXXMC
■INTRODUCTION
MLCC(MultilayerCeramic Capacitor) is SMD(SurfaceMounted Device) type capacitor that is used in wide ranges of capacitance. MLCC is paid more attentions than other capacitors due to the better frequency characteristics, higher reliability, higher withstanding voltage and so on.
MLCC is made of many layers of ceramic and inner electrodes like sandwich. Pd was used for inner electrodes. But the price of Pd was skyrocketed and Pd was replaced by the BME(BaseMetal Electrode), which reduced the total cost of MLCC.
This inner electrode is connected to outer termination for surface mounting, which is composed of three layers, Cu or Ag layer, Ni plating layer, and SnPb or Sn plating layer. Most of MLCCs become Pb free by the environmental issue at present.
MLCC is divided into two classes. Class I(C0G,etc) is the temperature compensating type. It has a small TCC(TemperatureCoefficient of Capacitance) and a better frequency performance. Therefore, it is used in RF applications such as cellular phone, tuner, and so on. Class II(X7R,X5R, Y5V, etc) is the high dielectric constant type, which is used in general electronic circuit. Especially high capacitance MLCC is replacing other capacitors (Tantalumand Aluminum capacitor) due to the low ESR(EquivalentSeries Resistance) value.
■FEATURE AND APPLICATION
●Feature -Miniature Size
-Wide Capacitance and Voltage Range -Highly Reliable Performance
-Tape &Reel for Surface Mount Assembly -Low ESR
-High Q at High Frequencies
-Stable Temperature Dependence of Capacitance ●Application
-High Frequency Circuit(Tuner,VCO, PAM etc) -General Power Supply Circuit(SMPSetc) -DC-DC Converter
-General Electronic Circuit
■
STRUCTURE
■APPEARANCE AND DIMENSION
CODE [**************]5
EIA CODE
L
[***********][1**********]220
0.6±0.031.0±0.051.6±0.12.0±0.13.2±0.23.2±0.34.5±0.45.7±0.4
DIMENSION (mm ) W 0.3±0.030.5±0.050.8±0.11.25±0.11.6±0.22.5±0.23.2±0.35.0±0.4
T (MAX)0.3±0.030.5±0.050.8±0.11.25±0.11.6±0.22.5±0.23.2±0.33.2±0.3
BW 0.15±0.050.2+0.15/-0.10.3±0.20.5+0.2/-0.30.5+0.2/-0.30.6±0.30.8±0.31.0±0.3
■PREVIOUS PART NUMBERING
SAMSUNG Multilayer Ceramic Capacitor ●
Type(Size)●
Capacitance Temperature Characteristics ●
Nominal Capacitance ●
Capacitance Tolerance ●
Rated Voltage ●
Thickness Option ●
Packaging Type ●
CAPACITANCE TEMPERATURE CHARACTERISTICS ●
CLASS Ⅰ(TemperatureCompensation) Symbol C P R S T U L
EIA Code C0G(CH)P2H R2H S2H T2H U2J S2L
Temperature
Coefficient(PPM/℃)
0±30-150±60-220±60-330±60-470±60-750±120+350~-1000
※Temperature
Characteristics
C ΔP ΔR ΔS ΔT ΔU ΔSL
Operation
Temperature Range
-55~+125℃
※Temperature Characteristics Temperature
below 2.0pF 2.2~3.9pF above 4.0pF
Characteristics
C ΔP ΔR ΔS ΔT ΔU Δ
C0G -----C0G P2J R2J S2J T2J U2J
C0G P2H R2H S2H
T2H U2J
above 10pF
C0G P2H R2H S2H T2H U2J
☞K :±250PPM/℃J :±120PPM/℃H :±60PPM/℃G :±30PPM/℃
CLASS Ⅱ(HighDielectric Constant)
Symbol A B F
EIA Code X5R X7R Y5V
Capacitance Change
(ΔC :%)
±15±15+22~-82
Operation
Temperature Range
-55~+85℃-55~+125℃-30~+85℃
NOMINAL CAPACITANCE ●
The nominal capacitance value is expressed in pico-Farad(pF)and identified by three-digit number, first two digits represent significant figures and last digit specifies the number of zeros to follow. For values below 1pF, the letter "R" is used as the decimal point and the last digit becomes significant.
example)
100:10×10o =020:2×10o =1R5:1.5pF
10pF 2pF
102:10×
102=1000pF
CAPACITANCE TOLERANCE ●
Temperature Characteristics
Symbol B C
C0G(NPO)
or T.C Series
D F G J K
A(X5R)B(X7R)F(Y5V)
J K M Z
Tolerance ±0.1pF ±0.25pF ±0.5pF ±1pF ±2%±5%±10%±5%±10%±20%-20%~+80%
E-6Series E-12Series
E-24Series for over 10pF Applicable Capacitance &Range
0.5~3pF 0.5~10pF 6~10pF
※Please consult us for special tolerances.
RATED VOLTAGE ●
THICKNESS OPTION ●Symbol N A B C D E
Description of the Code
Standard thickness (pleaserefer to standard thickness table on next page) Thinner than standard thickness Thicker than standard thickness
Standard Thickness High Q (Low `D.F `) Sn-100%(High-Q)Sn-100%(General)
※Please Consult us for other termination type.
PACKAGING TYPE ●STANDARD CAPACITANCE STEP Series E-3E-6E-12E-24
1.01.01.1
1.0
1.21.21.3
1.51.51.61.0
1.5
1.81.82.0
2.22.22.4
2.2
2.72.73.0
3.33.33.6
Capacitance Step
2.2
3.3
3.93.94.3
4.74.75.1
4.7
5.65.66.2
6.86.87.54.7
6.8
8.28.29.1
※Standard Capacitance is " Each step ×10n "
■NEW PART NUMBERING
SAMSUNG Multilayer Ceramic Capacitor ●
Size(mm)●
Capacitance Temperature Characteristic ●
Nominal Capacitance ●
Capacitance Tolerance ●
Rated Voltage ●
Thickness Option ●
Product &Plating Method ●
Samsung Control Code ●
Reserved For Future Use ●
Packaging Type ●
PRODUCT ABBREVIATION ●
Symbol CL
Product Abbreviation
SAMSUNG Multilayer Ceramic Capacitor
SIZE(mm)●
Symbol [**************]5
Size(mm)
Length 0.61.01.62.03.23.24.55.7
Width 0.30.50.81.21.62.53.25.0
CAPACITANCE TEMPERATURE CHARACTERISTIC ●Symbol C P R S T U L A B F
Class ⅡClass Ⅰ
Temperature Characteristics COG P2H R2H S2H T2H U2J S2L X5R X7R Y5V
C △P △R △S △T △U △S △X5R X7R Y5V
0±30(ppm/℃) -150±60-220±60-330±60-470±60-750±60+350~-1000
±15%±15%+22~-82%
-55~+85℃-55~+125℃-30~+85℃-55~+125℃Temperature Range
※Temperature Characteristic
Temperature Characteristics
C ΔP ΔR ΔS ΔT ΔU Δ
Below 2.0pF
C0G -----2.2~3.9pF
C0G P2J R2J S2J T2J U2J
Above 4.0pF
C0G P2H R2H S2H T2H U2J
Above 10pF
C0G P2H R2H S2H T2H U2J
J :±120PPM/℃, H :±60PPM/℃, G :±30PPM/℃
NOMINAL CAPACITANCE ●
Nominal capacitance is identified by 3digits.
The first and second digits identify the first and second significant figures of the capacitance. The third digit identifies the multiplier. 'R' identifies a decimal point. ●Example
Symbol 1R5103104
Nominal Capacitance
1.5pF
10,000pF, 10nF, 0.01μF 100,000pF, 100nF, 0.1μF
CAPACITANCE TOLERANCE ●
Symbol A B C D F F G J K M Z
Tolerance ±0.05pF ±0.1pF ±0.25pF ±0.5pF ±1pF ±1%±2%±5%±10%±20%+80,-20%
More than 10pF Less than 10pF (Including10pF) Nominal Capacitance
RATED
VOLTAGE ●
THICKNESS OPTION ●
Type [1**********]8
Symbol
358A
2012
C F C
3216
F H F H
3225
I J F H
4532
I J L F H
5750
I J L
2.02.51.251.6
±0.20
2.02.53.21.251.6
±0.20
2.02.53.2
±0.30±0.30
Thickness(T)
0.300.500.800.65
±0.10
0.851.250.851.251.61.251.6
±0.20±0.10±0.15±0.15±0.20Spec ±0.03±0.05±0.10
PRODUCT &PLATING METHOD ●Symbol A N G
Electrode
Pd Ni Cu
Termination
Ag Cu Cu
Plating Type Sn_100%Sn_100%Sn_100%
SAMSUNG CONTROL CODE
●
RESERVED FOR FUTURE USE ●
Symbol N
Description of the code Reserved for future use
PACKAGING TYPE
●
CAPACITANCE vs CHIP THICKNESS STANDARD
Description
[1**********]8(0201)(0402)(0603)
0.6±0.030.3±0.030.3±0.03
1.0±0.050.5±0.050.5~±0.050.5~240
1.6±0.10.8±0.10.8±0.1
0.65±0.1
2012Type (0805)
2.0±0.1
3216Type (1206)
3.2±0.15
3.2±0.21.6±0.2
3225Type (1210)
3.2±0.3
4532Type (1812)
4.5±0.4
5750Type (2220)
5.7±0.4
L
Dimension (mm)
W 1.25±0.10.85±0.1
1.6±0.152.5±0.2
1.251.6±0.2±0.2
2.0±0.2
2.5±0.2
1.25±0.2
3.2±0.31.6±0.2
2.0±0.2
2.5±0.2
5.0±0.41.62.0±0.2±0.2
2.5±0.2
T
1.250.851.251.6±0.1±0.15±0.15±0.2
SL 50V C R A A P N A
25V G C
E I
T C, TC p A (ExceptF N SL,UJ) C
50V E
-
0.5~0.5~1600~0.5~3000~6200~
1000~[***********]008200
-----------
0.5~470.5~2200.5~1000
--
3300~1500~3900~7500~[**************]00
----------
()
-
0.5~1800.5~10000.5~620~1100~0.5~2400~[***********]0
-
560~1100024000~
~
[**************]
-
1000~24000~62000~[**************]0
[***********]00
6.3V 102202200--10000--100004700~100004700
---22000---47000--47000
10V
A (X5R)
[1**********]0~470-
--2200-----220006800~10000-
------47000
16V -47--1000------------
25V --6.8~1047~10033~10010~334.7~100.22~4.7-220~33010~22010~332.2~10
----------------
50V
C A P A C I T A N C E R A N G E (n F )
6.3V
F (Y5V)
-0.1~100.1~100.1~1-
-470~1000220~470100~22047~1000.22~1002200100~1000100~100022~3302.2~100
------6800~10000
-----------
6.3V -220~27068~20039~680.22~39-
-330~470220~33082~10047~100-
1000560~1000390~1000150~470220
-----22000-------
10V
B (X7R)
-
1000~47001500~33003900~[1**********]0
----22000---
16V
330~1000~2200~1500~33003900~[***********]0100~470~3306201~150-220
680~1000390~1000-680~180015002.2~680-820~1000-2200
---2200----
25V --10~1000-
-1000---100003300~4700-
50V -10~100-
-------
10000-47000------
10V -10~68010~2202.2~68
-4700-
470010000~
22000
---22000------100000
16V -
820~1200~1000~2700~100003300~[***********][**************]~47082~150
560~1000180~1000
470~1200~2700~1000~4700~[***********]00010~470
560~1000
-100~1000
--
---22000----
25V -----10000---
50V ------10000---
■PACKAGING
●CARDBOARD PAPER TAPE
Symbol Type
03
D i m e n s i o n
05102131
W F E P1
2.0±0.05
P2P0D t
0.37±0.030.6±0.05
A
0.38±0.03
B
0.68±0.03
0.651.15+0.05/-0.1+0.05/-0.11.1±0.2
1.9±0.22.4±0.23.6±0.2
8.0±0.33.5±0.051.75±0.1
4.0±0.1
2.0±0.054.0±0.1Φ1.5+0.1/-0
1.1MAX
1.6±0.22.0±0.2
●EMBOSSED PLASTIC TAPE
●TAPING SIZE
unit :pcs
Symbol 7" Reel 13" Reel
Cardboard Paper Tape
400015000
Embossed Plastic Tape
2000-
●REEL DIMENSION
unit :mm
Symbol 7" Reel 13" Reel
A φ178±2.0φ330±2.0
B min. φ50min. φ70
φ13±0.5
21±0.8
2.0±0.5
10±1.5
0.8±0.2
1.0
C
D
E
W
t
R
●BULK CASE PACKAGING
-Bulk case packaging can reduce the stock space and transportation costs. -The bulk feeding system can increase the productivity. -It can eliminate the components
loss.
Symbol Dimension Symbol Dimension
A 6.8±0.1F 31.5+0.2/-0
B 8.8±0.1W 36+0/-0.2
T 12±0.1G 19±0.35
C 1.5+0.1/-0
H 7±0.35
D 2+0/-0.1
L 110±0.7
E 4.7±0.1
I 5±0.35
●QUANTITY
Size Quantity *Option
05(0402)50,000
10(0603)10,000~15,000*
21(0805)
T ≤0.85mm 10,000
T ≥1.0mm 5,000
■CHARACTERISTIC MAP
●CLASS Ⅰ
Temperature Characteristics
Size 05(0402)10(0603)
Voltage
0.5
10
100
240
1000
Capacitance Range (㎊)
10000
100000
[**************]
100000000
50V
50V 1000
SL,UJ
21(0805)31(1206)03(0201)05(0402)
50V
2700
50V
8200
25V 25V 50V 25V 50V 25V 50V 25V 50V 50V 100V 25V 50V 50V
47
220180
[1**********]0
33001500
100008200
10(0603)
21(0805)
C(COG)&TC Series
31(1206)
4700
560
4700
4700018000
100000
1000
43000
68000
130000
32(1210)
43(1812)55(2220)
●CLASS Ⅱ, A(X5R)
Temperature Characteristics
Size Voltage
10
100
Capacitance Range (㎊)
1000
10000
100000
[***********]000000
0603(0201)
6.3V 10V 6.3V
1000010000
[1**********]0
47000
6800
10000
[1**********]000
330000
470000
10000000
[1**********]000
10000000
4700000
[**************]
[**************]0
6800000
10000000
[***********]000000
1005(0402)
10V 16V 50V 6.3V
1608(0603)
10V 16V 6.3V
A(X5R)
2012(0805)
10V 16V 6.3V
3216(1206)
10V 16V 6.3V
3225(1210)
10V 16V
4532(1812)5750(2220)
6.3V 6.3V 10V
●CLASS Ⅱ, B(X7R)
Temperature Characteristics
Capacitance Range (㎊)
Size
Voltage
10
[1**********]0
1000
[***********]0
220
4700
[***********]47000
220
[***********][1**********]00
1000000
[**************]0
220
[***********]00220000
[1**********]000
[***********][***********]000
6.3V
03(0201)
10V 16V 6.3V 10V
05(0402)
16V 25V 50V 6.3V 10V
10(0603)
16V 25V 50V 6.3V 10V
21(0805)
16V 25V 50V 6.3V 10V
31(1206)
16V 25V 50V
1000010000
[1**********]0
33000
10000
B(X7R)
10000000
[***********]0001000000
[1**********]0
1000
●CLASS Ⅱ, B(X7R)
Temperature Characteristics
Capacitance Range (㎊)
Size
Voltage
10
100
1000
10000
100000
[***********]000000
22000000
[***********]00
2200
[***********]0001000000
22000000
[1**********]000
10000
1000000
10000000
3300000
4700000
6.3V 10V
32(1210)
16V 25V 50V
B(X7R)
43(1812)
10V 16V 25V 50V
55(2220)
25V 50V
●CLASS Ⅱ, F(Y5V)
Temperature Characteristics
Size
03(0201)
Voltage
10
100
1000
Capacitance Range (㎊)
1000010000
220000
1000010000
2200
3300010000
2200000
[1**********]0
22000
2200
[1**********]0
10000000
4700000
1000010000
2200
[***********]0004700000
[***********][1**********]0
100000
[1**********]0
6.3V 10V
05(0402)
16V 25V 50V 6.3V 10V
[1**********]000
10(0603)
16V 25V 50V 6.3V 10V
21(0805)
16V 25V
F(Y5V)
50V 10V
31(1206)
16V 25V 50V 6.3V 10V
32(1210)
16V 25V 50V 16V
43(1812)
25V 50V
55(2220)
10V
100000
[1**********]000
1000000
[***********]000000
100000000
10000
[**************]0
[1**********]00
[1**********]000
[***********][1**********]000
■RELIABILITY TEST DATA
NO 1
ITEM APPEARANCE
PERFORMANCE
NO ABNORMAL EXTERIOR APPEARANCE 10,000㏁OR 500㏁·㎌PRODUCT WHICHEVER IS
2
INSULATION RESISTANCE
SMALLER
(RATEDVOLTAGE IS BELOW 16V :10,000㏁OR 100㏁·㎌)
TEST CONDITION
THROUGH MICROSCOPE(×10)
RATED VOLTAGE SHALL BE APPLIED.
MEASUREMENT TIME IS 60~120RATED VOLTAGE TIME 60SEC.
3
WITHSTANDING
VOLTAGE
NO DIELECTRIC BREAKDOWN OR MECHANICAL BREAKDOWN
CLASS Ⅰ:300%OF THE RATED VOLTAGE FOR 1~5SEC, CLASS Ⅱ:250%OF THE RATED VOLTAGE FOR 1~5SEC IS APPLIED WITH LESS THAN 50㎃CURRENT
CAPACITANCE
CLASS Ⅰ
4
CAPACIT ANCE
CLASS Ⅱ
WITHIN THE SPECIFIED TOLERANCE
WITHIN THE SPECIFIED TOLERANCE
1,000㎊AND BELOW MORE THAN 1,000㎊CAPACITANCE 10㎌AND BELOW MORE THAN
10㎌CAPACITANCE
CLASS Ⅰ
OVER 30㎊:Q ≥1,000
LESS THAN 30㎊:Q ≥400+20C
(C :CAPACITANCE )
1,000㎊AND BELOW MORE THAN 1,000㎊
FREQUENCY 1㎒±10%
VOLTAGE
0.5~5Vrms
1㎑±10%FREQUENCY 1㎑±10%120㎐±20%FREQUENCY 1㎒±10%
0.5~5Vrms
1㎑±10%FREQUENCY 1㎑±10%120㎐±20%
VOLTAGE 1.0±0.2Vrms 0.5±0.1Vrms VOLTAGE 1.0±0.2Vrms 0.5±0.1Vrms VOLTAGE
5Q
1. CHAR :B
RATED VOLTAGE
CAPACITANCE
DF SPEC 0.05max 0.05max 0.035max 0.025max 0.025max
10㎌AND BELOW MORE THAN 10㎌
6.3V 10V 16V 25V 50V 이상
2. CHAR :F
6
Tan δ
CLASS Ⅱ
[***********]2545325750
6.3V -0.16max 0.16max 0.16max 0.16max 0.16max
10V 0.125max 0.125max 0.125max 0.125max 0.125max 0.16max 0.125max
16V 25V 0.05max 0.05max(C≤100nF) 0.07max(C>100nF)
0.07max 0.07max 0.07max(C≤6.8㎌) 0.09max(C>6.8㎌)
--
50V 0.05max 0.05max 0.05max 0.05max 0.05max
--
0.09max (C<220nF) 0.125max (C≥220nF)
0.09max 0.09max 0.09max 0.09max 0.09max
-
*THE INITIAL VALUE OF HIGH DIELECTRIC CONSTANT SERIES SHALL BE MEASURED
AFTER THE HEAT TREATMENT OF 150+0/-10℃, 1Hr AND SITTING OF 48±4hr AT ROOM TEMPERATURE &ROOM HUMIDITY.
NO
ITEM
APPEARANCE
PERFORMANCE
NO MECHANICAL DAMAGE SHALL OCCUR CHARACTERISTIC
CAPACITANCE CHANGE WITHIN ±5%OR
CAPACITANCE
CLASS Ⅰ
±0.5㎊WHICHEVER IS LARGER
CLASS Ⅱ
Q
HUMIDITY
14
(STEADYSTATE)
CLASS Ⅰ
A,B F
WITHIN ±12.5%WITHIN ±30%
MEASURE AT ROOM TEMPERATURE AFTER COOLING FOR CLASS Ⅰ:24±2Hr. CLASS Ⅱ:48±4Hr.
6.3V Tan δ
6.3V 0.075MAX
4V 0.1MAX
TEST CONDITION
TEMPERATURE TEST TIME
:40±2℃
RELATIVE HUMIDITY:90~95%RH
:500+12/-0Hr.
30㎊AND OVER :Q ≥35010~30㎊
:Q ≥275+2.5×C
LESS THAN 10pF :Q ≥200+10×C
CHAR.
25V AND OVER 0.05
16V
10V 0.05MAX
0.125MAX *Condition1005C ≥0.22㎌1608C ≥2.2㎌2012C ≥4.7㎌3216C ≥10.0㎌3225C ≥22.0㎌4532C ≥47.0㎌5750C ≥100.0㎌
Tan δCLASS Ⅱ
A,B 0.05MAX 0.1MAX (C〈1.0㎌) 0.125MAX (C≥1.0㎌)
CLASS Ⅱ(A,B)
F
0.075MAX 0.15MAX 0.195MAX 0.25MAX
INSULATION RESISTANCE APPEARANCE
MINIMUM INSULATION RESISTANCE:
1,000㏁OR 50㏁·㎌PRODUCT WHICHEVER IS SMALLER
NO MECHANICAL DAMAGE SHALL OCCUR CHARACTERISTIC
CAPACITANCE CHANGE WITHIN ±7.5%OR
CLASS Ⅰ
±0.75㎊WHICHEVER IS LARGER
A,B
WITHIN ±12.5%WITHIN ±30%WITHIN +30~-40%
CLASS
Ⅱ
F
1005C>0.47μF 1608C>1.0μF 2012C>4.7μF 3216C>10.0μF 3225C>22.0μF 4532C>47.0μF
APPLIED VOLTAGE :
RATED VOLTAGE
TEMPERATURE :40±2℃RELATIVE HUMIDITY:90~95%RHTEST TIME :500+12/-0Hr. CURRENT APPLIED :50㎃MAX.
CLASS ⅡSHOULD BE MEASURED INITIAL VALUE AFTER BE HEAT-TREATED FOR 1HR IN 150℃+0/-10℃AND BE LEFT FOR 48±4HR AT ROOM TEMPERATURE.
CLASS ⅠSHOULD BE MEASURED AFTER LEFT FOR 24±2HRS IN ROOM TEMPERATURE AND HUMIDITY. CLASS ⅡSHOULD BE MEASURED LATTER VALUE AFTER BE
HEAT-TREATED FOR 1HR IN 150℃+0/-10℃AND BE LEFT FOR 48±4HR AT ROOM TEMPERATURE.
CAPACITANCE
MOISTURE
15
RESISTANCE
Q CLASS Ⅰ
30㎊AND OVER :Q ≥200
30㎊AND BELOW :Q ≥100+10/3×C
CHAR.
25V AND OVER 0.05MAX
16V
10V
6.3V
4V
6.3V Tan δ0.125MAX *Condition1005C ≥0.22㎌
Tan δCLASS Ⅱ
A,B
0.05MAX 0.1MAX (C〈1.0㎌) 0.125MAX (C≥1.0㎌)
0.05MAX 0.075MAX 0.1MAX
CLASS Ⅱ(A,B)
1608C ≥2.2㎌2012C ≥4.7㎌3216C ≥10.0㎌3225C ≥22.0㎌4532C ≥47.0㎌5750C ≥100.0㎌
F
0.075MAX 0.15MAX 0.195MAX 0.25MAX
INSULATION RESISTANCE
MINIMUM INSULATION RESISTANCE:500㏁OR 25㏁·㎌PRODUCT, WHICHEVER IS SMALLER.
NO
ITEM
PERFORMANCE
TEST CONDITION
APPLIED VOLTAGE :
150%,200%OF RATED VOLTAGE TEST TIME :1000+48/-0Hr. CURRENT APPLIED :50㎃MAX.
APPEARANCE NO MECHANICAL DAMAGE SHALL OCCUR
CHAR.
CHARACTERISTIC
CLASS Ⅰ
A,B
CAP. CHANGE
WITHIN ±3%OR ±0.3㎊, WHICHEVER IS LARGER WITHIN ±12.5%WITHIN ±30%
CAPACITANCE
CLASS Ⅱ
HIGH
16
TEMPERATURE RESISTANCE
Q CLASS Ⅰ
10~30㎊
F
WITHIN+30~40%1005C>0.47μF 1608C>1.0μF 2012C>4.7μF 3216C>10.0μF 3225C>22.0μF 4532C>47.0μF
30㎊AND OVER :Q ≥350
:Q ≥275+2.5×C
LESS THAN 10㎊:Q≥200+10×C CHAR.
AND OVER
TEMP. 125±3℃
A
85±3℃125±3℃85±3℃
CLASS ⅠCLASS Ⅱ
B F
CLASS ⅡSHOULD BE MEASURED INITIAL VALUE AFTER BE HEAT-TREATED FOR 1HR IN 150℃+0/-10℃AND BE LEFT FOR 48±4HR AT ROOM TEMPERATURE.
CLASS ⅠSHOULD BE MEASURED AFTER LEFT FOR 24±2HRS IN ROOM TEMPERATURE AND HUMIDITY.
CLASS ⅡSHOULD BE MEASURED LATTER VALUE AFTER BE HEAT-TREATED FOR 1HR IN 150℃+0/-10℃AND BE LEFT FOR 48±4HR AT ROOM TEMPERATURE.
*150%Authorization
Conditions
25V
16V 0.05MAX
0.1MAX (C
10V 0.05MAX
6.3V 0.075MAX
4V 0.1MAX
1005C>0.47μF 1608C ≥2.2㎌
CLASS Ⅱ(A,B,F)
2012C ≥4.7㎌3216C ≥10.0㎌3225C ≥22.0㎌4532C ≥47.0㎌5750C ≥100.0㎌
Tan δCLASS Ⅱ
A,B
0.05MAX
F
0.075MAX 0.15MAX 0.195MAX 0.25MAX
(TWICEOF RATED VOLTAGE WILL BE
INSULATION RESISTANCE
MINIMUM INSULATION RESISTANCE:1,000㏁OR 50㏁·㎌PRODUCT WHICHEVER IS SMALLER
NO MECHANICAL DAMAGE SHALL OCCUR CHARACTERISTIC
CAP. CHANGE
WITHIN ±2.5%
APPLIED TO ALL SERIES BUT ABOVE) **HOWEVER, SEE (FIG.3)
A/B는1005C ≥0.22㎌
APPEARANCE
CAPACITORS SHALL BE SUBJECTED TO FIVE CYCLES OF THE
TEMPERATURE CYCLE AS FOLLOWING STEP 1234
TEMP.(℃) MIN.RATED TEMP.+0/-3
25MAX.RATED TEMP.+3/-0
25
TIME(MIN)
302~3302~3
CAPACITANCE
CLASS ⅠOR ±0.25㎊WHICHEVER IS LARGER
CLASS
17
TEMPERATURE
CYCLE
Q CLASS ⅠTan δCLASS ⅡINSULATION RESISTANCE
Ⅱ
A,B F
WITHIN ±7.5%WITHIN ±20%
30㎊AND OVER :Q ≥1000LESS THAN 30㎊:Q≥400+20×C TO SATISFY THE SPECIFIED INITIAL VALUE
TO SATISFY THE SPECIFIED INITIAL VALUE
MEASURE AT ROOM TEMPERATURE AFTER COOLING FOR CLASS Ⅰ:24±2Hr. CLASS Ⅱ:48±4Hr.
■CHARACTERISTIC GRAPH
●ELECTRICAL CHARACTERISTICS
CAPACITANCE -TEMPERATURE CHARACTERISTICS
CAPACITANCE -DC VOLTAGE CHARACTERISTICS CAPACITANCE CHANGE -
AGING
■APPLICATION MANUAL
●Storage Condition
Storage Environment
The electrical characteristics of MLCCs were degraded by the environment of high temperature or humidity. Therefore, the MLCCs shall be stored in the ambient temperature and the relative humidity of less than 40℃and 70%,respectively. Guaranteed storage period is within 6months from the outgoing date of delivery.
Corrosive Gases
Since the solderability of the end termination in MLCC was degraded by a chemical atmosphere such as chlorine, acid or sulfide gases, MLCCs must be avoid from these gases.
Temperature Fluctuations
Since dew condensation may occur by the differences in temperature when the MLCCs are taken out of storage, it is important to maintain the temperature-controlled environment.
●Design of Land Pattern
When designing printed circuit boards, the shape and size of the lands must allow for the
proper amount of solder on the capacitor. The amount of solder at the end terminations has a direct effect on the crack. The crack in MLCC will be easily occurred by the tensile stress which was due to too much amount of solder. In contrast, if too little solder is applied, the termination strength will be insufficiently. Use the following illustrations as guidelines for proper land design. Recommendation of Land Shape and Size
●Adhesives
When flow soldering the MLCCs, apply the adhesive in accordance with the following conditions. Requirements for Adhesives
They must have enough adhesion, so that, the chips will not fall off or move during the handling of the circuit board.
They must maintain their adhesive strength when exposed to soldering temperature. They should not spread or run when applied to the circuit board. They should harden quickly.
They should not corrode the circuit board or chip material.
They should be a good insulator.
They should be non-toxic, and not produce harmful gases, nor be harmful when touched. Application Method
It is important to use the proper amount of adhesive. Too little and much adhesive will cause poor adhesion and overflow into the land, respectively.
Adhesive hardening Characteristics
To prevent oxidation of the terminations, the adhesive must harden at 160℃or less, within 2minutes or less.
●Mounting
Mounting Head Pressure
Excessive pressure will cause crack to MLCCs. The pressure of nozzle will be 300g maximum during mounting.
Bending Stress
When double-sided circuit boards are used, MLCCs first are mounted and soldered onto one side of the board. When the MLCCs are mounted onto the other side, it is important to support the board as shown in the illustration. If the circuit board is not supported, the crack occur to the ready-installed MLCCs by the bending stress.
●Flux
Although the solderability increased by the highly-activated flux, increase of activity in flux may also degrade the insulation of the chip capacitors. To avoid such degradation, it is recommended that a mildly activated rosin flux(lessthan 0.2%chlorine) be used.
●Soldering
Since a multilayer ceramic chip capacitor comes into direct contact with melted solder during soldering, it is exposed to potentially mechanical stress caused by the sudden temperature change. The capacitor may also be subject to silver migration, and to contamination by the flux. Because of these factors, soldering technique is critical. Soldering Methods
Method
-Overall heating
Reflow soldering
-Local heating
Flow soldering
-Single wave -Double wave
Classification
-Infrared rays -Hot plate
-VPS(vaporphase) -Air heater -Laser
-Light beam
-
*We recommend the reflow soldering method.
Soldering Profile
To avoid crack problem by sudden temperature change, follow the temperature profile in the adjacent
graph.
℃
[**************]50
℃
300250200
15010050
60~120sec3~4sec
Reflow Soldering Flow Soldering
Manual Soldering
Manual soldering can pose a great risk of creating thermal cracks in chip capacitors. The hot
soldering iron tip comes into direct contact with the end terminations, and operator's carelessness
may cause the tip of the soldering iron to come into direct contact with the ceramic body of the capacitor. Therefore the soldering iron must be handled carefully, and close attention must be paid to the selection of the soldering iron tip and to temperature control of the tip.
Amount of
Solder
Cooling
Natural cooling using air is recommended. If the chips are dipped into solvent for cleaning, the temperature difference(△T) must be less than 100℃6-6. Cleaning
If rosin flux is used, cleaning usually is unnecessary. When strongly activated flux is used, chlorine in the flux may dissolve into some types of cleaning fluids, thereby affecting the chip capacitors. This means that the cleaning fluid must be carefully selected, and should always be new.
Notes for Separating Multiple, Shared PC Boards.
A multi-PC board is separated into many individual circuit boards after soldering has been
completed. If the board is bent or distorted at the time of separation, cracks may occur in the chip capacitors. Carefully choose a separation method that minimizes the bending of the circuit board.
■CROSS REFERENCE
P/N
①COMPANY
COMPANY
MODEL(MLCC)
0201(0603)0402(1005)0603(1608)0805(2012)
②SIZE (EIA/JIS)
1206(3216)1210(3225)1808(4520)1812(4532)2220(5750)
SAMSUNG
CL [***********]
AVX --[***********]1018081812-
JOHANSON
--R07R14R15R18S41R29S43-
KEMET C -[***********][1**********]220
KYOCERA
CM [***********]55
MURATA GRM 3336394042-642-2-43-244-1
NOVACAP
--[***********][1**********]221
PANASONIC
ECJ Z 01234---
ROHM MCH -1518213132-43-
TAIYO -YUDEN MK [***********]-432550
TDK C [***********][***********]
VITRAMON
VJ -[***********]1018081812-
COG(NPO)C A N G CG COG/CHN C A C COG/CHA
P2H(N150)R2H(N220)S2H(N330)
③
TEMPERATURE CHARACTERISTIC
U2J(N750)
S2L X7R Z5U T2H(N470)
P R S T U L B E
S 13O Z Y C E
------W Z
------R(X)U
P R S T U SL X7R -
P2H R2H S2H T2H U2J SL X7R Z5U
------B Z
P R S T U G B -
----UJ SL C E
P R S T U SL BJ -
PH RH SH TH UJ SL X7R(B)Z5U
------Y(X)U
Y5V F G Y V Y5V Y5V Y F F F Y5V -
④NOMINAL CAPACITANCE ⑤CAPACITANCE TOLERANCE
6.3V 10V 16V 25V 50V 100V 200V 250V 500V 630V 1000V 2000V 3000V 4000V NICKEL BARRIER
⑦TERMINATION
Ag/PdBULK(VINYL)PAPER TAPING
⑧PACKAGE
PLASTIC TAPING BULK CASE
E P
1, 37
E, U -P B C
192, 4
-(NONE)T, R
Q P O A B C D E G H I J K -N
6Z Y 3512V 7-A G H J T
V B:±0.1㎊
-[***********]-501-102202302
EX) 103=10,000㎊C:±0.25㎊
9843512-------C -----D:±0.5㎊
[***********][***********]04000A B B T, L H, N C
221=220㎊
F:±1%
6.[***********]5006301K 2K 3K -(GRM)(GR)PB PT PT PC
225=2,200,000㎊=2.2㎌G:±2%
--[***********]501-[1**********]2N P *T --J:±5%
1R5=1.5㎊K:±10%0J 1A 1C 1E 1H 2A 2D ---------X E,V,W F, Y C
010=1㎊
Z:-20~+80%
J L E T U -----------B T T -0J 1A 1C 1E 1H 2A -2E -2J 3A 3D 3F ---B T ----J X A B C -E -G -H -X F B C, P T, R G
M:±20%
-43251--------(MCH)(MC)-K, L P, Q C
⑥RATED VOLTAGE
SAMSUNG :CL10B104KA8NNNC
AVX :06033C104KAT2A
JOHANSON :250R14W104KV6T
KEMET :C0603C104K3RAC
KYOCERA :CM105X7R104K25AT
MURATA :GRM188R71E104KA01D
NOVACAP :0603B104K250N_TM
PANASONIC :ECJ1EB1E104K
ROHM :MCH182C104KKN
TAIYO-YUDEN :TMK107BJ104K_T
TDK :C1608X7R1E104KT
VITRAMON :VJ0603Y104KXXMC